Millimeter-wave power amplifier linearity characterization using Unequally Spaced Multi-Tone stimulus
This paper presents an implementation of Ka band linearity measurement. In this paper large signal measurement using the innovative Unequally Spaced Multi-Tone wideband test signal have been performed in order to assess the in-band linearity degradation of non-linear microwave power devices. The proposed test bench is suitable for both on-wafer and connectorized devices characterization, using a sub-6GHz source and an RF mixer to up convert the signal into Ka band.
In this paper a first result of comparison between NPR with a notch and USMT test signal has been demonstrated; it shows very similar behavior using similar signal statistics, bandwidth, peak-to-average, etc… at 6 GHz frequency carrier. This comparison has been done with simulations and experimentally on the same test bench, to ensure to be in the same condition.