Securing RF/Analog Circuits Through Lifetime via Multi-Variate Authentication and Identification
RF and analog circuits are becoming the weak link in security of electronic systems due the lack of mechanisms for effectively authenticating device and process parameters, as well as tracking them over their lifetime via identification mechanisms. Luckily, the availability of multiple analog measurements provides a path to solve this problem. In this talk, we will discuss various mechanisms of utilizing this multi-variate information for authenticating device layout, agreed-upon process PDK, as well as assigning a unique identifier that can be tracked through the integration phase of the device. The techniques depend on measuring various performance parameters under enhanced test modes, which include supply modulation and unspecified performance metrics, such as DC offsets.