Portable Low-Cost Measurement Setup for 2D Imaging of Organic Semiconductors
A portable test-fixture for the imaging of discontinuities in novel materials, such as organic semiconductors, is designed, manufactured, and validated. A 10 GHz split-post dielectric resonator (SPDR) compliant with the IEC norm is used as a microwave probe. It is built into a custom-made 2D shift-shift scanner, providing non-destructive microwave-transparent support for the sample-under-test. Microwave signal generation and measurements are performed by a new dedicated scalar network analyzer, called Q Meter. The setup is controlled by Windows application, which allows also connecting to professional VNAs. Verification of the portable scanner is provided with respect to stand-alone SPDR and laboratory VNA. It is then applied to a PEDOT sample of current interest in organic electronics.